Selected Conference Papers:

  • A. Mukherjee, R. Akis, D. Vasileska, and A. H. Goldan, “A Monte Carlo solution to hole transport processes in avalanche selenium semiconductors,” 2020 SPIE OPTO, 11274, San Francisco, USA.
  • H. Kannan, J. Stavro, A. Mukherjee, S. Léveillé, K. Kisslinger, L. Guan, … and A.H. Goldan, “Solution-Processed Ceria Interface Layer for Enhancing Performance of Avalanche Amorphous-Selenium Photodetectors,” 2020 IEEE NSS MIC, pp. 1-3, Boston, USA, doi: 10.1109/NSS/MIC42677.2020.9507944.
  • A. LaBella, X. Cao, W. Zhao, and A. H. Goldan, “Flood Histogram Quality Metric for Light Sharing Depth-Encoding PET Modules,” 2020 IEEE NSS MIC, pp. 1-3, Boston, USA. doi: 10.1109/NSS/MIC42677.2020.9508077.
  • A. Mukherjee, R. Akis, D. Vasileska, and A. H. Goldan, “Multiscale Modeling of High Field Hole Transport and Excess Noise in Avalanche Amorphous Selenium Layers,” 2020 IEEE NSS MIC, pp. 1-3, Boston, USA, doi: 10.1109/NSS/MIC42677.2020.9507883.