Selected Conference Abstracts:

  • H. Kannan, J. Stavro, A. Mukherjee, S. Léveillé, K. Kisslinger, L. Guan, … and A.H. Goldan, “Solution-Processed Ceria Interface Layer for Enhancing Performance of Avalanche Amorphous-Selenium Photodetectors,” 2020 IEEE NSS MIC N-05-06, Boston, USA.
  • A. LaBella, X. Cao, X. Zeng, W. Zhao, and A. H. Goldan, “Sub-2 mm Depth of Interaction Resolution with Prism-PET using Convolutional Neural Networks: An Experimental Study,” 2020 IEEE NSS MIC M-16-01, Boston, USA.
  • A. LaBella, X. Cao, W. Zhao, and A. H. Goldan, “Prism-PET: Experimental Performance of a High Resolution Single-Ended Readout Depth-Encoding PET Module,” 2020 IEEE NSS MIC M-03-004, Boston, USA.
  • A. LaBella, S. Tavernier, C. Woody, M. Purschke, W. Zhao, and A. H. Goldan, “Sub-100 ps Coincidence Time Resolution in Prism-PET Modules Using Convolutional Neural Networks: A Monte Carlo Simulation Study,” 2020 IEEE NSS MIC M-15-072, Boston, USA.
  • A. LaBella, X. Cao, W. Zhao, and A. H. Goldan, “Flood Histogram Quality Metric for Light Sharing Depth-Encoding PET Modules,” 2020 IEEE NSS MIC M-08-302, Boston, USA.
  • A. Mukherjee, R. Akis, D. Vasileska, and A. H. Goldan, “Multiscale Modeling of High Field Hole Transport and Excess Noise in Avalanche Amorphous Selenium Layers,” 2020 IEEE NSS MIC N-10-05, Boston, USA.
  • R. Akis, L. Ho, A. Mukherjee, H. Kannan, J. Stavro, D. Vasileska, A. Sahu, W. Zhao, and A. H. Goldan, “Modeling Hole Injection In a-Se Devices,” 2020 IEEE NSS MIC N-20-062, Boston, USA.