Bruker Innova Atomic Force Microscope includes:

• stacked piezo XY and Z scanners with resolutions as high as <0.02 and <0.01 nm, respectively
• high precision XYZ motorized stage
• optical AFM head for contact, tapping, lateral force, and phase imaging AFM and scanning tunneling microscopy (STM)
• optical AFM head for co-localization and tip-enhanced Raman scattering (TERS), improving Raman spatial resolution to <20 nm in XY and Raman scattering efficiency by >1,000-fold
• on-axis optical microscope with high-resolution (HR) video camera
• Trackball-guided motorized AFM optical coupler to Renishaw spectrometer that includes separate video optics, Raman interface IRIS software, a long working distance 60x objective for off-axis illumination of the AFM probe tip (~60° to probe axis) and collection of Raman scattered emissions.
• Special AFM-TERS package – tuning fork cartridge and Au-wire probes for non-conducting samples (biologicals and organic polymers)
• liquid MicroCell for aqueous AFM measurements
• NanoDrive control and NanoScope Image Analysis software

AFM images (left to right: height, tapping amplitude and 3D topography) of dual-phase polymer film acquired in tapping mode

 Image of a gold TERS tip engaging the sample surface and its reflection obtained by video camera in Renishaw optical coupler to the AFM.