The Laboratory for Synchrotron X-Ray Topography at the Department of Materials Science & Chemical Engineering, Stony Brook University, NY is actively involved in studying crystalline materials being developed for high technology applications. Materials are characterized primarily by Synchrotron X-ray Topography based techniques.
High Resolution X-ray Diffraction (HRXRD), Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM) and other characterization techniques are also extensively employed. Materials studied include wide bandgap semiconductors such as silicon carbide, aluminum and gallium nitride for power electronics, III-V and II-VI semiconductors for LEDs and laser diodes, oxides such as sapphire and garnets, silicon for integrated circuits and solar cells, etc.
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