Professor Michael Dudley
1.1 Tertiary Education
1975-78 Undergraduate Student, University of Warwick, Coventry, U.K. B.Sc.(Hons) in Materials Science and Physics, 1978 (graduated top of class).
1978-81 Graduate Student, University of Warwick. Ph.D. in Engineering Science, 1982. Thesis Advisor, Prof. D.K. Bowen. Thesis Title: “Deformation Studies on Fe 3.5 wt % Si by X-ray Topography”.
1979-80 Graduate Student Visitor at Prof. A. Authier’s Laboratory, Laboratoire de Mineralogie – Crystallographie, Universite de Paris VI, working with Prof. J. Miltat.
1.2 Career Appointments
1981-84 Postdoctoral Research Assistant, Dept. of Pure & Applied Chemistry, University of Strathclyde, Glasgow, Scotland, working with Prof. J.N. Sherwood.
1984-90 Assistant Professor, Dept. of Materials Science & Engineering, College of Engineering & Applied Science(CEAS), State University of New York (SUNY) at Stony Brook.
1990-94 Associate Professor, Dept. of Materials Science & Engineering, College of Engineering & Applied Science(CEAS), State University of New York (SUNY) at Stony Brook.
1993-2018 Chairman, Dept. of Materials Science & Engineering, College of Engineering & Applied Science (CEAS), State University of New York (SUNY) at Stony Brook.
1994- Professor, Dept. of Materials Science & Engineering, College of Engineering & Applied Science (CEAS), State University of New York (SUNY) at Stony Brook.
1.3 Research Interests
Dudley’s research interests focus on crystal growth and characterization of defect structures in crystals with a view to determining their origins. The primary technique used is Synchrotron Topography which enables analysis of defects and generalized strain fields in single crystals in general, with particular emphasis on semiconductor, optoelectronic, and optical crystals, especially SiC, GaN, AlN, InP CdZnTe, HgCdTe, AlN, B12As2, ZnSe, and sapphire as well as proteins and other related materials. Establishing the relationship between crystal growth conditions and resulting defect distributions is a particular thrust area of interest to Dudley, as is the correlation between electronic/optoelectronic device performance and defect distribution. Also of interest is the understanding of the origins and extent of damage introduced during crystal surface preparation. Current in situ studies of defect formation during PVT and CVD crystal growth of SiC are consistent with these themes. Other techniques routinely used in such analysis include Transmission Electron Microscopy, High Resolution Triple-Axis X-ray Diffraction, Atomic Force Microscopy, Scanning Electron Microscopy, Nomarski Optical Microscopy, Conventional Optical Microscopy, IR Microscopy and Fluorescent Laser Scanning Confocal Microscopy. Dudley’s group is playing a prominent role in the development of SiC growth, helping to characterize crystals grown by many of the commercial entities involved.
2 PROFESSIONAL ACTIVITIES
2.1 Research Related
1986 Session Chairman at “Symposium on Solid State Polymerization and the Structure and Properties of Polymers Produced by Lattice Controlled Processes”, ACS Spring Meeting, New York, NY.
1987-92 Faculty Sponsor of The Metallurgical Society (TMS) Student Chapter (The Materials Science Club), SUNY at Stony Brook.
Spring, 1989 Organizer and Chair of joint seminar series entitled “Interfaces Between Materials and Solid Mechanics Research”, coordinated with Department of Mechanical Engineering at Stony Brook.
Feb. 1989 Invited lecturer in the “Sundays at Stony Brook” lecture series (organized by Provost Schubel). Contribution, entitled, “Materials That Changed the World”, organized by Prof. H. Herman, Dept. of Materials Science & Engineering. Lecture title, “Synchrotron Radiation and the Characterization of Materials”.
1991 Co-organizer of 1991 NSLS User’s Meeting.
1991 Organizer of 1991 NSLS User’s Meeting Poster Session.
1993 – Member of Organizing Committee for 5th International Conference on Synchrotron Radiation Instrumentation, held at SUNY Stony Brook, July, 1994.
1993 – Member of International Advisory Committee for the International Conference on the Chemistry of the Organic Solid State (ICCOSS).
1993 Appointed chairman of ICCOSS XIII, held at Stony Brook, July 1997.
1996 Co-Chairman of Electronic Materials Conference Symposium on Non-Destructive Testing, Santa Barbara, CA, June 26-28, 1996.
1997 Chairman of ICCOSS XIII, held at Stony Brook, July 13-18, 1997.
1997 Co-Chairman of “X-TOP U.S. ‘97” satellite symposium to the “Denver X-ray Conference” held in Steamboat Springs, CO, August 4-8, 1997.
1997-2005 Appointed Consultant Member of International Union of Crystallography Commission on Crystal Growth and Characterization of Materials.
2001 Chairman of “ONR Workshop on Challenges in Porous and Amorphous Semiconductors”, held in Corner Brook, Newfoundland, June 10-14, 2001.
2001 Co-Chair of “Symposium on X-ray Diffraction for Crystal Perfection and Growth” at the “Thirteenth American Conference on Crystal Growth and Epitaxy”, held in Burlington, VT, August 12-16, 2001.
2003 Chairman of “ONR Workshop on Extended Defects in Wide Gap Semiconductors” held in Irvington, VA, July 13-17,(2003).
2004 Co-Chair of Spring Materials Research Society Symposium on “SiC: Materials, Processing and Devices”, held in San Francisco, CA, April 14-15, (2004).
2005 Chair of “ONR MURI review Meeting on Growth of Wide Bandgap Substrates”, held at Stony Brook, April 21-22, (2005).
2005 Session Chair, Fall MRS Meeting Symposium on GaN, AlN, InN and Related Materials, held in Boston, MA, November 28-December 2, (2005).
2006 Co-Chair of Spring Materials Research Society Symposium on “SiC: Materials, Processing and Devices”, held in San Francisco, CA, April 18-20, (2006).
2006 Session Chair, Spring Materials Research Society Symposium on “SiC: Materials, Processing and Devices”, held in San Francisco, CA, April 18-20, (2006).
2007 Appointed to Program Committee (Characterization) of 20th Indium Phosphide and Related Materials Conference, held in Versailles, France, May 25-29, (2008).
2008 Co-Chair of Spring Materials Research Society Symposium on “SiC: Materials, Processing and Devices”, held in San Francisco, CA, March 24-28, (2008).
2008 -2011Appointed to Editorial Board of Applied Physics Letters and Journal of Applied Physics
2008 Appointed to Advisory Committee for X-TOP 2008 (9th Biennial Conference on High Resolution X-ray Diffraction and Imaging) held in Linz, Austria, September 15-19, 2008.
2008 Appointed joint Program Chair of XIII International Conference on Defects: Recognition, Imaging and Physics (DRIP) in Semiconductors held in Oglebay Resort and Conference Center, Wheeling, West VA, September 13-17, 2009.
2008 Appointed to the Technical Program Committee for the 2009 International Conference on Silicon Carbide and Related Materials (ICSCRM) held in Nurnberg, Germany, October 11-16, 2009.
2008 Appointed to the Organizing Committee for the 2011 International Conference on Silicon Carbide and Related Materials (ICSCRM), held in Cleveland, OH, September 11-16, 2011.
2010 Co-Chair of Spring Materials Research Society Symposium on “SiC: Materials, Processing and Devices”, held in San Francisco, CA, April 5-9, (2010).
2010 Co-Chair of 52nd Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at University of Notre Dame, Indiana, June 23-25, (2010).
2010 Co-Chair of Fall Materials Research Society Symposium on “Boron and Boron Compounds – From Fundamentals to Applications”, held in Boston, MA, November 29-30, (2010).
2011 Co-Chair of 53rd Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at University of California Santa Barbara, CA, June 22-24, (2011).
2011 Co-Chair of 220th Electrochemical Society Meeting Symposium on GaN and SiC Power Technologies, held in Boston, MA, October 9-14, 2011.
2012 Co-Chair of 54th Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at Penn. State University, June 20-22, 2012.
2012 Co-Chair of 222nd Electrochemical Society Meeting Symposium on GaN and SiC Power Technologies, held in Honolulu, HI, October 7-12, 2012.
2012 Appointed to the Technical Program Committee for the 2013 International Conference on Silicon Carbide and Related Materials (ICSCRM) held in Miyazaki, Japan September 29 – October 4, 2013.
2013 Co-Chair of 55th Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at University of Notre Dame, Indiana, June 26-28, (2013).
2013 Co-Chair of 224th Electrochemical Society Meeting Symposium on GaN and SiC Power Technologies, held in San Francisco, CA, October 27 – November 1, 2013.
2014 Co-Chair European Materials Research Society Meeting Symposium on “Crystal Growth Related Twins and Point Defects”, held in Lille, France, May 25-30, (2014).
2014 Co-Chair of 56th Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at University of California, Santa Barbara, June 26-28, (2014).
2014 Co-Chair of 226th Electrochemical Society Meeting Symposium on GaN and SiC Power Technologies, held in Cancun, Mexico, October 5 – 9, 2014.
2015 Appointed to the Technical Program Committee for the 2015 International Conference on Silicon Carbide and Related Materials (ICSCRM) held in Giardini Naxos, Sicily, Italy, October 4-9, 2015.
1987- 2014 Spokesperson and Contact Person, Stony Brook X-ray Topography Facility (beamline X-19C), NSLS, BNL.
2014 Co-Chair of 57th Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at Columbus, OH, June 24-26, (2015).
2015 Co-Chair of 228th Electrochemical Society Meeting Symposium on GaN and SiC Power Technologies, held in Phoenix, AZ, October 11 – 16, 2015
2016 Co-Chair of 58th Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at Newark, DE, June 22-24, (2016)
2016 Co-Chair of 229th Electrochemical Society Meeting Symposium on GaN and SiC Power Technologies, held in Honolulu, HI, October 2-7, 2016
2017 Co-Chair of 59th Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” Co-Chair of Symposium on 59th Electronic Materials Conference, held at University of Notre Dame, South Bend, Indiana, US, June 28-30, (2017),
2017 Co-Chair (with B. Raghothamachar) of Symposium on “Bulk Growth and Epitaxy for Power Electronics”, at 21st American Conference on Crystal Growth and Epitaxy (ACCGE-21) and 18th US Workshop on Organometallic Vapor Phase Epitaxy (OMVPE-18) and 3rd Symposium on 2D Electronic Materials and Symposium on Epitaxy of Complex Oxides, held in Santa Fe, NM, July 30 – August 4, 2017.
2017 Appointed to the Technical Program Committee for the 2017 International Conference on Silicon Carbide and Related Materials (ICSCRM) held in Washington DC, September 17-22, 2017.
2017 Co-Chair of 232nd Electrochemical Society Meeting Symposium on GaN and SiC Power Technologies, held in National Harbor, MD, October 1-5, 2017
2018 Co-Chair of 60th Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at University of Santa Barbara, Santa Barbara, CA, June 27-29, (2018).
2018 Appointed to the Technical Program Committee for the 2018 European Conference on Silicon Carbide and Related Materials (ECSCRM) held in Birmingham, UK, September 2-6, 2018.
2018 Co-Chair of AiMES 2018, ECS and SMEQ Joint International Meeting Symposium on GaN and SiC Power Technologies, Held in Cancun, Mexico, September 30 – October 4, 2018
2018 Appointed to the Technical Program Committee for the 2019 International Conference on Silicon Carbide and Related Materials (ICSCRM) to be held in Kyoto, Japan, September 29 – October 4, 2019.
2018 Appointed to the Steering Committee for the Defect Recognition and Imaging in Physics (DRIP) Conference.
2019 Co-Chair of 61st Electronic Materials Conference (EMC) Symposium on “Silicon Carbide: Growth, Processing, Characterization, Theory and Devices,” held at University of Michigan, Ann Harbor, MI, June 26-28, (2019).
2019 Appointed to the Technical Program Committee for the 2019 European Conference on Silicon Carbide and Related Materials (ECSCRM) to be held in Tours, France, September 13-17, 2019.
Ongoing Actvities
1984-Present: Referee for several scientific journals, including: Materials Science & Engineering, Journal of Polymer Science, Materials Letters, Materials Research Society Symposium Proceedings, Journal of Applied Crystallography, Nature, Philosophical Magazine, Journal of Crystal Growth, Journal of Applied Physics, Physical Review B, Physical Review Letters, Applied Physics Letters, and Nature Materials.
1985-Present: Referee for several funding agencies, including: National Science Foundation, Department of Energy, Petroleum Research Fund of the American Chemical Society.
1986-Present: Consultant for various companies, including SGS-Thomson Microelectronics (1986-1987), Texas Instruments (1986-1990), General Electric (2001-2007), II-VI Corporation (2002-2009), Saint-Gobain Crystals (2012), GrafTech (2014), and Dow Corning (2014).
1987-2014: Director of National Consortium for Synchrotron X-ray Topography, beamline X-19C, at the NSLS, BNL.
1990-2013: X-ray Topography Subgroup Representative on User’s Executive Committee at NSLS.
2006-2010: Appointed to Technical Advisory Board of Amberwave Systems Corporation.
2006-Present: Appointed to International Steering Committee for European Conference on Silicon Carbide and Related Materials (ECSCRM).
2.2 Society Memberships
1984 – Member, Materials Research Society.
1985 – Member, American Chemical Society;
Member, The Metallurgical Society (TMS) of AIME.
1988 – Member, Sigma Xi.
1989 – Member, American Society of Metals;
Member, American Association for the Advancement of Science.
2.3 Expert Witness Experience
2010-2011 Expert (engaged by Quinn, Emanuel, Urquhart and Sullivan LLP; Weil, Gotshal and Manges LLP on behalf of Cree Inc.) in patent case Fox Group versus Cree Inc. Was Deposed. Case brought to Summary Judgement prior to trial.
2010-2011 Expert (engaged by Orrick LLP on behalf of Dow Corning) in patent case Fox Group versus Dow Corning.
2012 Expert (engaged by Finnegan, Henderson, Farabow, Garrett and Dunner LLP on behalf of Charles and Colvard) regarding patent application relating to SiC gemstones.
2013 Expert (engaged by White & Case LLP via IMS Expert Services on behalf of Tera Xtal Technology Corporation) on case GTAT Inc. versus Tera Xtal Technology Corporation. Provided reports.
3. Google Scholar
6,738 Citations (as of April 27, 2020)
h-index of 42 (At least 42 papers that have received at least 42 citations)
4. Presentations and Full Publications including
1. Patents
2. Monographs, Edited Proceedings and Chapters in Books
3. Book Reviews
4. Refereed Articles
Please refer to my Curriculum Vitae for details