Group Photos
(2023 Chinese New Year Celebration. From left: Qianyu Cheng, Zeyu Chen, Michael Dudley, Balaji Raghothamachar, Yafei Liu, and Shanshan Hu. Photo taken in January 2023 at Green Tea Restaurant, Stony Brook, NY)
(Dr. Daren Wu, student-in-law of the group, celebrating his graduation with all group members and some of their family members. From left: Xiao Han, Zeyu Chen, Balaji Raghothamachar, Qianyu Cheng, Daren Wu, Paige Liu, Michael Dudley, Yafei Liu, and Shanshan Hu. Photo taken in April 2023 at TAO’s Fusion Restaurant, Selden, NY)
PI: Professor Michael Dudley
Michael.Dudley@StonyBrook.edu
Research Assistant Professor: Dr. Balaji Raghothamachar
Balaji.Raghothamachar@StonyBrook.edu
Graduate Students
Yafei Liu
Yafei.Liu@StonyBrook.edu
PhD. Candidate MSE Stony Brook University 2018-present
M.S. Materials Engineering University of Southern California 2013-2015
B.S. Materials Physics Hebei University of Technology 2009-2013
Research Interest: GaN and SiC crystal growth and characterization of defect structures in the crystal. Synchrotron x-ray topography is the primary technique. Together with x-ray diffraction, electron microscope and other characterization techniques, relationship between crystal growth process and crystal quality can be established. Current studies include characterization of HVPE GaN, ammonothermal GaN and 4H-SiC substrates and epitaxial wafers used in power electronic device fabrication.
Linkedin: http://www.linkedin.com/in/yafei-liu-267076a4
Zeyu Chen
Zeyu.Chen@StonyBrook.edu
PhD. Candidate MSE Stony Brook University 2019-present
B.E. Engineering Science Stony Brook University 2014-2019
Research Interest: Defect and strain analysis in SiC materials subjected to high-energy ion implantation and annealing used in superjunction devices.
Linkedin: https://www.linkedin.com/in/zeyu-chen-346bb2230/
Qianyu Cheng
PhD. Candidate MSE Stony Brook University 2020-present
M.S. MSE Stony Brook University 2019-2020
B.S. Engineering Chemistry Stony Brook University 2015-2019
Research Interest: Synchrotron X-ray topography, Defect analysis in SiC and ZnSe.
Linkedin: https://www.linkedin.com/in/qianyu-jane-cheng-a3b560b1/
Shanshan Hu
PhD. Candidate MSE Stony Brook University 2020-present
M.S. MSE Zhejiang University 2013-2016
B.S. Materials Physics Hebei University of Technology 2009-2013
Research Interest: Characterization of defect structures in wide band gap semiconductor materials using synchrotron x-ray topography.
Linkedin: http://www.linkedin.com/in/shanshan-hu-7423a2174
Previous PhD Students
25. Hongyu Peng, 2022, Characterization of Defects and Strain in SiC and AlGaInP/GaAs Materials Using Synchrotron X-ray Topography and High Resolution X-ray Diffraction Complemented by Ray Tracing Simulations
LinkedIn: https://www.linkedin.com/in/hongyu-peng-949224174
24. Tuerxun Ailihumaer, 2021, Investigation of Defect Behavior and Lattice Strain in PVT-Grown 4H Silicon Carbide Bulk Crystals
LinkedIn: https://www.linkedin.com/in/ailihumaer-tuerxun-5b8054172
23. Jianqiu Guo, 2018, Analysis of Defect Structures in 4H Silicon Carbide Bulk Crystals, Epitaxial Layers and Power Devices
LinkedIn: https://www.linkedin.com/in/jianqiu-guo
22. Yu Yang, 2017, Application of X-ray Topographic Techniques to Investigate Defect Behavior in PVT-grown 4H-SiC Crystals
LinkedIn: https://www.linkedin.com/in/yu-yang-b3308674
21. Raymond Conley, 2017, Thin Films for X-ray Optics
LinkedIn: https://www.linkedin.com/in/ray-conley-9381257
20. Ouloide Goue, 2016, Characterization of Structural Defects in Wide Band-Gap Compound Materials for Semiconductor and Opto-Electronic applications
LinkedIn: https://www.linkedin.com/in/ouloide-yannick-goue-976075110
19. Fangzhen Wu, 2014, Defect Characterization in 4H Silicon Carbide Bulk Crystals and Epilayers
LinkedIn: https://www.linkedin.com/in/fangzhen-wu-84026b59
18. Huanhuan Wang, 2014, Studies of Growth Mechanism and Defec Origins in 4H-Silicon Carbide Substrates and Homoepitaxial Layers
LinkedIn: https://www.linkedin.com/in/huanhuanwang
17. Mengjia Gaowei, 2014, Diamond detector–material science, design and application
LinkedIn: https://www.linkedin.com/in/mgaowei
16. Shayan Byrappa, 2013, Defect studies in 4H- Silicon Carbide PVT grown bulk crystals, CVD grown epilayers and devices
LinkedIn: https://www.linkedin.com/in/shayanbyrappa
15. Vishwanath Sarkar, 2012, Defect characterization and stress analysis by white beam synchrotron X-ray topography in single crystal semiconducting materials
LinkedIn: https://www.linkedin.com/in/vish-sarkar-phd-ab269522
14. Yu Zhang, 2011, Growth Mechanisms and Defect Structures of Boron Arsenide Epilayers Grown on 4H- and 6H-Silicon Carbide Substrates
LinkedIn: https://www.linkedin.com/in/yu-zhang-90826928/
13. Hui Chen, 2008, Defect structures and growth mechanisms of boron arsenide epilayers grown on 6H-silicon carbide and 15R-silicon carbide substrates
LinkedIn: https://www.linkedin.com/in/hui-chen-a6626323
12. Yi Chen, 2008, Defects Structures in Silicon Carbide Bulk Crystals, Epilayers and Devices
LinkedIn: https://www.linkedin.com/in/yi-chen-baa9116
11. Guan Wang, 2007, Organic/inorganic nanocomposite materials by electrospinning and their properties
LinkedIn: https://www.linkedin.com/in/guan-wang-272aa24/
10. Jie Bai, 2006, Studies of defects and strain relaxation in III-nitride epifilms
LinkedIn: https://www.linkedin.com/in/jie-bai-076046125
9. Huaibin Chen, 2005, Characterization of growth defects in piezoelectric single crystals by synchrotron white beam X-ray topography
8. Balaji Raghothamachar, 2001, Synchrotron white beam X -ray characterization of growth defects in bulk compound semiconductors
LinkedIn: https://www.linkedin.com/in/balaji-raghothamachar-00a4a35
7. David Bliss, 2000, Control of defects in bulk indium phosphide crystals: The relationship between growth parameters and the control of crystallographic and electronic properties
LinkedIn: https://www.linkedin.com/in/david-bliss-91141820
6. William M. Vetter, 1999, Characterization of dislocation structures in silicon carbide single crystals
5. Hua Chung, 1998, Studies of defect generation in CdZnTe and InP single crystals using synchrotron white beam x-ray topography
LinkedIn: https://www.linkedin.com/in/hua-chung-2794713
4. Thomas Fanning, 1996, MBE Growth and X-ray Characterization of Semiconductor Materials for Infrared Detectors
LinkedIn: https://www.linkedin.com/in/thomas-fanning-14788b10
3. Shaoping Wang, 1995, Characterization of growth defects in silicon carbide single crystals by synchrotron x-ray topography
LinkedIn: https://www.linkedin.com/in/shaoping-samuel-wang-b57b1338
2. Jun Wu, 1992, X-ray topographic investigation of dislocations in semiconductor materials
LinkedIn: https://www.linkedin.com/in/jun-wu-30138a8
1. Gongda Yao, 1992, Application of synchrotron white beam topography to the characterization of heterostructures
LinkedIn: https://www.linkedin.com/in/gongdayao
Previous MS Students
11. Haoyan Fang, 2020, Defect evaluation of structural defects in III-nitride wide bandgap semiconductors using synchrotron X-ray characterization
LinkedIn: https://www.linkedin.com/in/haoyan-fang-8ab79b196/
10. Yeonjae Ji, 2018, Analysis of Defect Structures on Wide Band-Gap Semiconductors for Optoelectronics and Lighting Applications
LinkedIn: https://www.linkedin.com/in/yeonjae-ji-62720913a
9. Shuang Wu, 2017, Synchrotron X-ray Characterization of Structural Defects in III-Nitride Wide Bandgap Semiconductors
LinkedIn: https://www.linkedin.com/in/shuang-wu-8171a7118
8. Jianing Yan, 2016, Synchrotron X-ray Topography Analysis of Dislocation Line Directions in 4H-SiC Single Crystals
LinkedIn: https://www.linkedin.com/in/jianingyan
7. Xiaolin Yang, 2016, Evaluation of 4H Silicon Carbide and Gallium Nitride Crystals for Power Electronics & Lighting Applications
LinkedIn: https://www.linkedin.com/in/xiaolin-yang-547354a3
6. Xuejin Wang, 2015, Defect Studies and Optimization of CVD Grown Boron Phosphide Films on Different Substrates
5. Zihao Ding, 2014, Defect Analysis of Boron Phosphide Thin Films and Sapphire Single Crystal Using Synchrotron X-ray Topography
LinkedIn: https://www.linkedin.com/in/zihao-ding-34109691
4. Ruifen Chen, 2014, Properties of Boron Phosphide Films Grown on Different Substrates and Conoscopic Study of Sapphire
LinkedIn: https://www.linkedin.com/in/ruifen-echo-chen-90541165
3. Zheyu Li, 2014, Synchrotron White Beam X-ray Topography Study of EFG Sapphire Ribbons
LinkedIn: https://www.linkedin.com/in/zheyu-li-02931459
2. Shun Sun, 2013, Defects Analysis of Wide Bandgap Semiconductor Single Crystals via Synchrotron White Beam X-ray Topography
LinkedIn: https://www.linkedin.com/in/shunsun
1. Tianyi Zhou, 2013, Threading Dislocation Characterization and Stress Mapping Depth Profiling via Ray Tracing Technique
LinkedIn: https://www.linkedin.com/in/tianyi-zhou-5a862660