PRiME 2020, ECS, the Electrochemical Society

• Synchrotron X-ray topography characterization of commercial GaN substrates for power electronic applications
  Yafei Liu, Shanshan Hu, Hongyu Peng, Tuerxun Ailihumaer, Balaji Raghothamachar, and Michael Dudley
• Characterization of Hazy Morphology on AlInP/GaAs Epitaxial Wafers Grown by Organometallic Vapor Phase Epitaxy
  Hongyu Peng, Tuerxun Ailihumaer, Balaji Raghothamachar and Michael Dudley

62nd Electronic Materials Conference

• X-ray topography characterization of GaN substrates used for power electronic devices
  Yafei Liu, Hongyu Peng, Tuerxun Ailihumaer, Balaji Raghothamachar, and Michael Dudley
• Characterization of Hazy Morphology on AlInP/GaAs Epitaxial Wafers Grown by Organometallic Vapor Phase Epitaxy (Poster)
  Hongyu Peng , Tuerxun Ailihumaer, Yafei Liu, Balaji Raghothamachar and Michael Dudley